Chen, Y.; Li, T.; Chai, G.; Wang, D.; Lu, B.; Guo, A.; Tian, J.
Enhancing Spin-Based Sensor Sensitivity by Avoiding Microwave Field Inhomogeneity of NV Defect Ensemble. Nanomaterials 2022, 12, 3938.
https://doi.org/10.3390/nano12223938
AMA Style
Chen Y, Li T, Chai G, Wang D, Lu B, Guo A, Tian J.
Enhancing Spin-Based Sensor Sensitivity by Avoiding Microwave Field Inhomogeneity of NV Defect Ensemble. Nanomaterials. 2022; 12(22):3938.
https://doi.org/10.3390/nano12223938
Chicago/Turabian Style
Chen, Yulei, Tongtong Li, Guoqiang Chai, Dawei Wang, Bin Lu, Aixin Guo, and Jin Tian.
2022. "Enhancing Spin-Based Sensor Sensitivity by Avoiding Microwave Field Inhomogeneity of NV Defect Ensemble" Nanomaterials 12, no. 22: 3938.
https://doi.org/10.3390/nano12223938
APA Style
Chen, Y., Li, T., Chai, G., Wang, D., Lu, B., Guo, A., & Tian, J.
(2022). Enhancing Spin-Based Sensor Sensitivity by Avoiding Microwave Field Inhomogeneity of NV Defect Ensemble. Nanomaterials, 12(22), 3938.
https://doi.org/10.3390/nano12223938