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Journal: Nanomaterials, 2022
Volume: 12
Number: 3766

Article: Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples
Authors: by Steffen Staeck, Anna Andrle, Philipp Hönicke, Jonas Baumann, Daniel Grötzsch, Jan Weser, Gesa Goetzke, Adrian Jonas, Yves Kayser, Frank Förste, Ioanna Mantouvalou, Jens Viefhaus, Victor Soltwisch, Holger Stiel, Burkhard Beckhoff and Birgit Kanngießer
Link: https://www.mdpi.com/2079-4991/12/21/3766

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