Mahjabin, S.; Haque, M.M.; Sobayel, K.; Selvanathan, V.; Jamal, M.S.; Bashar, M.S.; Sultana, M.; Hossain, M.I.; Shahiduzzaman, M.; Algethami, M.;
et al. Investigation of Morphological, Optical, and Dielectric Properties of RF Sputtered WOx Thin Films for Optoelectronic Applications. Nanomaterials 2022, 12, 3467.
https://doi.org/10.3390/nano12193467
AMA Style
Mahjabin S, Haque MM, Sobayel K, Selvanathan V, Jamal MS, Bashar MS, Sultana M, Hossain MI, Shahiduzzaman M, Algethami M,
et al. Investigation of Morphological, Optical, and Dielectric Properties of RF Sputtered WOx Thin Films for Optoelectronic Applications. Nanomaterials. 2022; 12(19):3467.
https://doi.org/10.3390/nano12193467
Chicago/Turabian Style
Mahjabin, Samiya, Md. Mahfuzul Haque, K. Sobayel, Vidhya Selvanathan, M. S. Jamal, M. S. Bashar, Munira Sultana, Mohammad Ismail Hossain, Md. Shahiduzzaman, Merfat Algethami,
and et al. 2022. "Investigation of Morphological, Optical, and Dielectric Properties of RF Sputtered WOx Thin Films for Optoelectronic Applications" Nanomaterials 12, no. 19: 3467.
https://doi.org/10.3390/nano12193467
APA Style
Mahjabin, S., Haque, M. M., Sobayel, K., Selvanathan, V., Jamal, M. S., Bashar, M. S., Sultana, M., Hossain, M. I., Shahiduzzaman, M., Algethami, M., Alharthi, S. S., Amin, N., Sopian, K., & Akhtaruzzaman, M.
(2022). Investigation of Morphological, Optical, and Dielectric Properties of RF Sputtered WOx Thin Films for Optoelectronic Applications. Nanomaterials, 12(19), 3467.
https://doi.org/10.3390/nano12193467