Article Versions Notes

Konvalina I, Paták A, Zouhar M, Müllerová I, Fořt T, Unčovský M, Materna Mikmeková E. Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors. Nanomaterials. 2022; 12(1):71. https://doi.org/10.3390/nano12010071

Konvalina, Ivo, Aleš Paták, Martin Zouhar, Ilona Müllerová, Tomáš Fořt, Marek Unčovský, and Eliška Materna Mikmeková. 2022. "Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors" Nanomaterials 12, no. 1: 71. https://doi.org/10.3390/nano12010071

Konvalina, I., Paták, A., Zouhar, M., Müllerová, I., Fořt, T., Unčovský, M., & Materna Mikmeková, E. (2022). Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors. Nanomaterials, 12(1), 71. https://doi.org/10.3390/nano12010071