Kang, S.C.; Kim, S.Y.; Lee, S.K.; Kim, K.; Allouche, B.; Hwang, H.J.; Lee, B.H.
Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors. Nanomaterials 2020, 10, 1186.
https://doi.org/10.3390/nano10061186
AMA Style
Kang SC, Kim SY, Lee SK, Kim K, Allouche B, Hwang HJ, Lee BH.
Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors. Nanomaterials. 2020; 10(6):1186.
https://doi.org/10.3390/nano10061186
Chicago/Turabian Style
Kang, Soo Cheol, So Young Kim, Sang Kyung Lee, Kiyung Kim, Billal Allouche, Hyeon Jun Hwang, and Byoung Hun Lee.
2020. "Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors" Nanomaterials 10, no. 6: 1186.
https://doi.org/10.3390/nano10061186
APA Style
Kang, S. C., Kim, S. Y., Lee, S. K., Kim, K., Allouche, B., Hwang, H. J., & Lee, B. H.
(2020). Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors. Nanomaterials, 10(6), 1186.
https://doi.org/10.3390/nano10061186