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Open AccessArticle

Label-Free Imaging of Single Nanoparticles Using Total Internal Reflection-Based Leakage Radiation Microscopy

1
Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China
2
Currently with Center for Terahertz Waves, College of Precision Instrument and Optoelectronics Engineering, and the Key laboratory of Opto-electronics Information and Technology (Ministry of Education), Tianjin University, Tianjin 300072, China
3
School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China
*
Author to whom correspondence should be addressed.
Nanomaterials 2020, 10(4), 615; https://doi.org/10.3390/nano10040615
Received: 21 February 2020 / Revised: 10 March 2020 / Accepted: 24 March 2020 / Published: 27 March 2020
(This article belongs to the Section Nanophotonics: Characterization, Modelling, and Nanodevices)
Label-free, fast, and single nanoparticle detection is demanded for the in situ monitoring of nano-pollutants in the environment, which have potential toxic effects on human health. We present the label-free imaging of single nanoparticles by using total internal reflection (TIR)-based leakage radiation microscopy. We illustrate the imaging of both single polystyrene (PS) and Au nanospheres with diameters as low as 100 and 30 nm, respectively. As both far-field imaging and simulated near-field electric field intensity distribution at the interface showed the same characteristics, i.e., the localized enhancement and interference of TIR evanescent waves, we confirmed the leakage radiation, transforming the near-field distribution to far-field for fast imaging. The localized enhancement of single PS and Au nanospheres were compared. We also illustrate the TIR-based leakage radiation imaging of single polystyrene nanospheres with different incident polarizations. The TIR-based leakage radiation microscopy method is a competitive alternative for the fast, in situ, label-free imaging of nano-pollutants. View Full-Text
Keywords: total internal reflection; evanescent waves; leakage radiation; nanoparticles; label-free imaging; microscopy total internal reflection; evanescent waves; leakage radiation; nanoparticles; label-free imaging; microscopy
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MDPI and ACS Style

Jiang, L.; Sun, X.; Liu, H.; Wei, R.; Wang, X.; Wang, C.; Lu, X.; Huang, C. Label-Free Imaging of Single Nanoparticles Using Total Internal Reflection-Based Leakage Radiation Microscopy. Nanomaterials 2020, 10, 615.

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