Article Versions Notes

Jiang L, Sun X, Liu H, Wei R, Wang X, Wang C, Lu X, Huang C. Label-Free Imaging of Single Nanoparticles Using Total Internal Reflection-Based Leakage Radiation Microscopy. Nanomaterials. 2020; 10(4):615. https://doi.org/10.3390/nano10040615

Jiang, Liwen, Xuqing Sun, Hongyao Liu, Ruxue Wei, Xue Wang, Chang Wang, Xinchao Lu, and Chengjun Huang. 2020. "Label-Free Imaging of Single Nanoparticles Using Total Internal Reflection-Based Leakage Radiation Microscopy" Nanomaterials 10, no. 4: 615. https://doi.org/10.3390/nano10040615

Jiang, L., Sun, X., Liu, H., Wei, R., Wang, X., Wang, C., Lu, X., & Huang, C. (2020). Label-Free Imaging of Single Nanoparticles Using Total Internal Reflection-Based Leakage Radiation Microscopy. Nanomaterials, 10(4), 615. https://doi.org/10.3390/nano10040615