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Journal: Nanomaterials, 2020
Volume: 10
Number: 615
615
Article: Label-Free Imaging of Single Nanoparticles Using Total Internal Reflection-Based Leakage Radiation Microscopy
Authors: by Liwen Jiang, Xuqing Sun, Hongyao Liu, Ruxue Wei, Xue Wang, Chang Wang, Xinchao Lu and Chengjun Huang
Link: https://www.mdpi.com/2079-4991/10/4/615

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