He, Z.; Yang, W.; Liu, Y.; Zheng, A.; Liu, J.; Lou, T.; Zhang, J.
Insulator Defect Detection Based on YOLOv8s-SwinT. Information 2024, 15, 206.
https://doi.org/10.3390/info15040206
AMA Style
He Z, Yang W, Liu Y, Zheng A, Liu J, Lou T, Zhang J.
Insulator Defect Detection Based on YOLOv8s-SwinT. Information. 2024; 15(4):206.
https://doi.org/10.3390/info15040206
Chicago/Turabian Style
He, Zhendong, Wenbin Yang, Yanjie Liu, Anping Zheng, Jie Liu, Taishan Lou, and Jie Zhang.
2024. "Insulator Defect Detection Based on YOLOv8s-SwinT" Information 15, no. 4: 206.
https://doi.org/10.3390/info15040206
APA Style
He, Z., Yang, W., Liu, Y., Zheng, A., Liu, J., Lou, T., & Zhang, J.
(2024). Insulator Defect Detection Based on YOLOv8s-SwinT. Information, 15(4), 206.
https://doi.org/10.3390/info15040206