Article Versions Notes

Wei M, Zhang Y, Wang Y, Liu X, Li X, Zheng X. Employing Atomic Force Microscopy (AFM) for Microscale Investigation of Interfaces and Interactions in Membrane Fouling Processes: New Perspectives and Prospects. Membranes. 2024; 14(2):35. https://doi.org/10.3390/membranes14020035

Wei, Mohan, Yaozhong Zhang, Yifan Wang, Xiaoping Liu, Xiaoliang Li, and Xing Zheng. 2024. "Employing Atomic Force Microscopy (AFM) for Microscale Investigation of Interfaces and Interactions in Membrane Fouling Processes: New Perspectives and Prospects" Membranes 14, no. 2: 35. https://doi.org/10.3390/membranes14020035

Wei, M., Zhang, Y., Wang, Y., Liu, X., Li, X., & Zheng, X. (2024). Employing Atomic Force Microscopy (AFM) for Microscale Investigation of Interfaces and Interactions in Membrane Fouling Processes: New Perspectives and Prospects. Membranes, 14(2), 35. https://doi.org/10.3390/membranes14020035