Wei, M.; Zhang, Y.; Wang, Y.; Liu, X.; Li, X.; Zheng, X.
Employing Atomic Force Microscopy (AFM) for Microscale Investigation of Interfaces and Interactions in Membrane Fouling Processes: New Perspectives and Prospects. Membranes 2024, 14, 35.
https://doi.org/10.3390/membranes14020035
AMA Style
Wei M, Zhang Y, Wang Y, Liu X, Li X, Zheng X.
Employing Atomic Force Microscopy (AFM) for Microscale Investigation of Interfaces and Interactions in Membrane Fouling Processes: New Perspectives and Prospects. Membranes. 2024; 14(2):35.
https://doi.org/10.3390/membranes14020035
Chicago/Turabian Style
Wei, Mohan, Yaozhong Zhang, Yifan Wang, Xiaoping Liu, Xiaoliang Li, and Xing Zheng.
2024. "Employing Atomic Force Microscopy (AFM) for Microscale Investigation of Interfaces and Interactions in Membrane Fouling Processes: New Perspectives and Prospects" Membranes 14, no. 2: 35.
https://doi.org/10.3390/membranes14020035
APA Style
Wei, M., Zhang, Y., Wang, Y., Liu, X., Li, X., & Zheng, X.
(2024). Employing Atomic Force Microscopy (AFM) for Microscale Investigation of Interfaces and Interactions in Membrane Fouling Processes: New Perspectives and Prospects. Membranes, 14(2), 35.
https://doi.org/10.3390/membranes14020035