Dong, Z.; Chen, X.; Wang, X.; Shi, Y.; Jiang, H.; Liu, S.
Dependence-Analysis-Based Data-Refinement in Optical Scatterometry for Fast Nanostructure Reconstruction. Appl. Sci. 2019, 9, 4091.
https://doi.org/10.3390/app9194091
AMA Style
Dong Z, Chen X, Wang X, Shi Y, Jiang H, Liu S.
Dependence-Analysis-Based Data-Refinement in Optical Scatterometry for Fast Nanostructure Reconstruction. Applied Sciences. 2019; 9(19):4091.
https://doi.org/10.3390/app9194091
Chicago/Turabian Style
Dong, Zhengqiong, Xiuguo Chen, Xuanze Wang, Yating Shi, Hao Jiang, and Shiyuan Liu.
2019. "Dependence-Analysis-Based Data-Refinement in Optical Scatterometry for Fast Nanostructure Reconstruction" Applied Sciences 9, no. 19: 4091.
https://doi.org/10.3390/app9194091
APA Style
Dong, Z., Chen, X., Wang, X., Shi, Y., Jiang, H., & Liu, S.
(2019). Dependence-Analysis-Based Data-Refinement in Optical Scatterometry for Fast Nanostructure Reconstruction. Applied Sciences, 9(19), 4091.
https://doi.org/10.3390/app9194091