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Journal: Appl. Sci., 2017
Volume: 7
Number: 885
Article:
Reduction of Bias and Light Instability of Mixed Oxide Thin-Film Transistors
Authors:
by
Mallory Mativenga, Jae Gwang Um and Jin Jang
Link:
https://www.mdpi.com/2076-3417/7/9/885
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