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SwissFEL: The Swiss X-ray Free Electron Laser

by Christopher J. Milne 1, Thomas Schietinger 1, Masamitsu Aiba 1, Arturo Alarcon 1, Jürgen Alex 1, Alexander Anghel 1, Vladimir Arsov 1, Carl Beard 1, Paul Beaud 1, Simona Bettoni 1, Markus Bopp 1, Helge Brands 1, Manuel Brönnimann 1, Ingo Brunnenkant 1, Marco Calvi 1, Alessandro Citterio 1, Paolo Craievich 1, Marta Csatari Divall 1, Mark Dällenbach 1, Michael D’Amico 1, Andreas Dax 1, Yunpei Deng 1, Alexander Dietrich 1, Roberto Dinapoli 1, Edwin Divall 1, Sladana Dordevic 1, Simon Ebner 1, Christian Erny 1, Hansrudolf Fitze 1, Uwe Flechsig 1, Rolf Follath 1, Franziska Frei 1, Florian Gärtner 1, Romain Ganter 1, Terence Garvey 1, Zheqiao Geng 1, Ishkhan Gorgisyan 1,†, Christopher Gough 1, Andreas Hauff 1, Christoph P. Hauri 1, Nicole Hiller 1, Tadej Humar 1, Stephan Hunziker 1, Gerhard Ingold 1, Rasmus Ischebeck 1, Markus Janousch 1, Pavle Juranić 1, Mario Jurcevic 1, Maik Kaiser 1, Babak Kalantari 1, Roger Kalt 1, Boris Keil 1, Christoph Kittel 1, Gregor Knopp 1, Waldemar Koprek 1, Henrik T. Lemke 1, Thomas Lippuner 1, Daniel Llorente Sancho 1, Florian Löhl 1, Carlos Lopez-Cuenca 1, Fabian Märki 1, Fabio Marcellini 1, Goran Marinkovic 1, Isabelle Martiel 1, Ralf Menzel 1, Aldo Mozzanica 1, Karol Nass 1, Gian Luca Orlandi 1, Cigdem Ozkan Loch 1, Ezequiel Panepucci 1, Martin Paraliev 1, Bruce Patterson 1,‡, Bill Pedrini 1, Marco Pedrozzi 1, Patrick Pollet 1, Claude Pradervand 1, Eduard Prat 1, Peter Radi 1, Jean-Yves Raguin 1, Sophie Redford 1, Jens Rehanek 1, Julien Réhault 1, Sven Reiche 1, Matthias Ringele 1, Jochen Rittmann 1,§, Leonid Rivkin 1,2, Albert Romann 1, Marie Ruat 1, Christian Ruder 1, Leonardo Sala 1, Lionel Schebacher 1, Thomas Schilcher 1, Volker Schlott 1, Thomas Schmidt 1, Bernd Schmitt 1, Xintian Shi 1, Markus Stadler 1,‖, Lukas Stingelin 1, Werner Sturzenegger 1, Jakub Szlachetko 1,‖, Dhanya Thattil 1, Daniel M. Treyer 1, Alexandre Trisorio 1, Wolfgang Tron 1, Seraphin Vetter 1, Carlo Vicario 1, Didier Voulot 1, Meitian Wang 1, Thierry Zamofing 1, Christof Zellweger 1, Riccardo Zennaro 1, Elke Zimoch 1, Rafael Abela 1,¶, Luc Patthey 1,* and Hans-Heinrich Braun 1,*
1
Paul Scherrer Institute, 5232 Villigen-PSI, Switzerland
2
École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
*
Authors to whom correspondence should be addressed.
Current address: CERN, 1211 Geneva, Switzerland.
Current address: Empa, 8600 Dübendorf, Switzerland.
§
Current address: Kistler AG, 8408 Winterthur, Switzerland.
Current address: Institute of Physics, Jan Kochanowski University, 25406 Kielce, Poland.
Current address: leadXpro AG, PARK innovAARE, 5234 Villigen, Switzerland.
Academic Editor: Kiyoshi Ueda
Appl. Sci. 2017, 7(7), 720; https://doi.org/10.3390/app7070720
Received: 13 June 2017 / Revised: 29 June 2017 / Accepted: 30 June 2017 / Published: 14 July 2017
(This article belongs to the Special Issue X-Ray Free-Electron Laser)
The SwissFEL X-ray Free Electron Laser (XFEL) facility started construction at the Paul Scherrer Institute (Villigen, Switzerland) in 2013 and will be ready to accept its first users in 2018 on the Aramis hard X-ray branch. In the following sections we will summarize the various aspects of the project, including the design of the soft and hard X-ray branches of the accelerator, the results of SwissFEL performance simulations, details of the photon beamlines and experimental stations, and our first commissioning results. View Full-Text
Keywords: X-ray free electron laser; linac; X-rays; undulator; SwissFEL; X-ray optics; X-ray photon diagnostics; ultrafast X-ray science; X-ray detector; JUNGFRAU; serial femtosecond crystallography X-ray free electron laser; linac; X-rays; undulator; SwissFEL; X-ray optics; X-ray photon diagnostics; ultrafast X-ray science; X-ray detector; JUNGFRAU; serial femtosecond crystallography
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Milne, C.J.; Schietinger, T.; Aiba, M.; Alarcon, A.; Alex, J.; Anghel, A.; Arsov, V.; Beard, C.; Beaud, P.; Bettoni, S.; Bopp, M.; Brands, H.; Brönnimann, M.; Brunnenkant, I.; Calvi, M.; Citterio, A.; Craievich, P.; Csatari Divall, M.; Dällenbach, M.; D’Amico, M.; Dax, A.; Deng, Y.; Dietrich, A.; Dinapoli, R.; Divall, E.; Dordevic, S.; Ebner, S.; Erny, C.; Fitze, H.; Flechsig, U.; Follath, R.; Frei, F.; Gärtner, F.; Ganter, R.; Garvey, T.; Geng, Z.; Gorgisyan, I.; Gough, C.; Hauff, A.; Hauri, C.P.; Hiller, N.; Humar, T.; Hunziker, S.; Ingold, G.; Ischebeck, R.; Janousch, M.; Juranić, P.; Jurcevic, M.; Kaiser, M.; Kalantari, B.; Kalt, R.; Keil, B.; Kittel, C.; Knopp, G.; Koprek, W.; Lemke, H.T.; Lippuner, T.; Llorente Sancho, D.; Löhl, F.; Lopez-Cuenca, C.; Märki, F.; Marcellini, F.; Marinkovic, G.; Martiel, I.; Menzel, R.; Mozzanica, A.; Nass, K.; Orlandi, G.L.; Ozkan Loch, C.; Panepucci, E.; Paraliev, M.; Patterson, B.; Pedrini, B.; Pedrozzi, M.; Pollet, P.; Pradervand, C.; Prat, E.; Radi, P.; Raguin, J.-Y.; Redford, S.; Rehanek, J.; Réhault, J.; Reiche, S.; Ringele, M.; Rittmann, J.; Rivkin, L.; Romann, A.; Ruat, M.; Ruder, C.; Sala, L.; Schebacher, L.; Schilcher, T.; Schlott, V.; Schmidt, T.; Schmitt, B.; Shi, X.; Stadler, M.; Stingelin, L.; Sturzenegger, W.; Szlachetko, J.; Thattil, D.; Treyer, D.M.; Trisorio, A.; Tron, W.; Vetter, S.; Vicario, C.; Voulot, D.; Wang, M.; Zamofing, T.; Zellweger, C.; Zennaro, R.; Zimoch, E.; Abela, R.; Patthey, L.; Braun, H.-H. SwissFEL: The Swiss X-ray Free Electron Laser. Appl. Sci. 2017, 7, 720.

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