Article Versions Notes

Inubushi Y, Inoue I, Kim J, Nishihara A, Matsuyama S, Yumoto H, Koyama T, Tono K, Ohashi H, Yamauchi K, et al. Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer. Applied Sciences. 2017; 7(6):584. https://doi.org/10.3390/app7060584

Inubushi, Yuichi, Ichiro Inoue, Jangwoo Kim, Akihiko Nishihara, Satoshi Matsuyama, Hirokatsu Yumoto, Takahisa Koyama, Kensuke Tono, Haruhiko Ohashi, Kazuto Yamauchi, and et al. 2017. "Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer" Applied Sciences 7, no. 6: 584. https://doi.org/10.3390/app7060584

Inubushi, Y., Inoue, I., Kim, J., Nishihara, A., Matsuyama, S., Yumoto, H., Koyama, T., Tono, K., Ohashi, H., Yamauchi, K., & Yabashi, M. (2017). Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer. Applied Sciences, 7(6), 584. https://doi.org/10.3390/app7060584