Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer
Inubushi, Y.; Inoue, I.; Kim, J.; Nishihara, A.; Matsuyama, S.; Yumoto, H.; Koyama, T.; Tono, K.; Ohashi, H.; Yamauchi, K.; Yabashi, M. Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer. Appl. Sci. 2017, 7, 584. https://doi.org/10.3390/app7060584
Inubushi Y, Inoue I, Kim J, Nishihara A, Matsuyama S, Yumoto H, Koyama T, Tono K, Ohashi H, Yamauchi K, Yabashi M. Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer. Applied Sciences. 2017; 7(6):584. https://doi.org/10.3390/app7060584
Chicago/Turabian StyleInubushi, Yuichi, Ichiro Inoue, Jangwoo Kim, Akihiko Nishihara, Satoshi Matsuyama, Hirokatsu Yumoto, Takahisa Koyama, Kensuke Tono, Haruhiko Ohashi, Kazuto Yamauchi, and Makina Yabashi. 2017. "Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer" Applied Sciences 7, no. 6: 584. https://doi.org/10.3390/app7060584