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Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer

Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan
RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
Pohang Accelerator Laboratory (PAL), POSTECH, 127-80 Jigokro, Nam-gu, Pohang, Gyeongbuk 37673, Korea
Author to whom correspondence should be addressed.
Academic Editor: Kiyoshi Ueda
Appl. Sci. 2017, 7(6), 584;
Received: 31 March 2017 / Revised: 24 May 2017 / Accepted: 30 May 2017 / Published: 6 June 2017
(This article belongs to the Special Issue X-Ray Free-Electron Laser)
PDF [971 KB, uploaded 7 June 2017]


We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 ± 1.1 fs. View Full-Text
Keywords: XFEL; spectroscopy; ultra-shot pulse XFEL; spectroscopy; ultra-shot pulse

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Inubushi, Y.; Inoue, I.; Kim, J.; Nishihara, A.; Matsuyama, S.; Yumoto, H.; Koyama, T.; Tono, K.; Ohashi, H.; Yamauchi, K.; Yabashi, M. Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer. Appl. Sci. 2017, 7, 584.

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