Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer
Yuichi Inubushi 1,2,*, Ichiro Inoue 2, Jangwoo Kim 3,4, Akihiko Nishihara 3, Satoshi Matsuyama 3, Hirokatsu Yumoto 1,2, Takahisa Koyama 1,2, Kensuke Tono 1,2, Haruhiko Ohashi 1,2, Kazuto Yamauchi 3 and Makina Yabashi 1,2
1
Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan
2
RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan
3
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
4
Pohang Accelerator Laboratory (PAL), POSTECH, 127-80 Jigokro, Nam-gu, Pohang, Gyeongbuk 37673, Korea
*
Author to whom correspondence should be addressed.
Academic Editor: Kiyoshi Ueda
Appl. Sci. 2017, 7(6), 584; https://doi.org/10.3390/app7060584
Received: 31 March 2017 / Revised: 24 May 2017 / Accepted: 30 May 2017 / Published: 6 June 2017
(This article belongs to the Special Issue X-Ray Free-Electron Laser)
Abstract
We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 ± 1.1 fs. View Full-TextKeywords:
XFEL; spectroscopy; ultra-shot pulse
▼
Figures
Figure 1
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
Share & Cite This Article
MDPI and ACS Style
Inubushi, Y.; Inoue, I.; Kim, J.; Nishihara, A.; Matsuyama, S.; Yumoto, H.; Koyama, T.; Tono, K.; Ohashi, H.; Yamauchi, K.; Yabashi, M. Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer. Appl. Sci. 2017, 7, 584.
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.
Related Articles
Article Metrics
Comments
[Return to top]
Appl. Sci.
EISSN 2076-3417
Published by MDPI AG, Basel, Switzerland
RSS
E-Mail Table of Contents Alert