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Open AccessArticle

Development of an Abbe Error Free Micro Coordinate Measuring Machine

School of Instrument Science and Opto-electric Engineering, Hefei University of Technology, No.193, Tunxi Road, Hefei 230009, China
Department of Mechanical Engineering, National Taiwan University, l, Sec.4, Roosevelt Road, Taipei 10617, Taiwan
Author to whom correspondence should be addressed.
Academic Editor: Chien-Hung Liu
Appl. Sci. 2016, 6(4), 97;
Received: 31 January 2016 / Revised: 21 March 2016 / Accepted: 25 March 2016 / Published: 5 April 2016
(This article belongs to the Special Issue Design and Applications of Coordinate Measuring Machines)
A micro Coordinate Measuring Machine (CMM) with the measurement volume of 50 mm × 50 mm × 50 mm and measuring accuracy of about 100 nm (2σ) has been developed. In this new micro CMM, an XYZ stage, which is driven by three piezo-motors in X, Y and Z directions, can achieve the drive resolution of about 1 nm and the stroke of more than 50 mm. In order to reduce the crosstalk among X-, Y- and Z-stages, a special mechanical structure, which is called co-planar stage, is introduced. The movement of the stage in each direction is detected by a laser interferometer. A contact type of probe is adopted for measurement. The center of the probe ball coincides with the intersection point of the measuring axes of the three laser interferometers. Therefore, the metrological system of the CMM obeys the Abbe principle in three directions and is free from Abbe error. The CMM is placed in an anti-vibration and thermostatic chamber for avoiding the influence of vibration and temperature fluctuation. A series of experimental results show that the measurement uncertainty within 40 mm among X, Y and Z directions is about 100 nm (2σ). The flatness of measuring face of the gauge block is also measured and verified the performance of the developed micro CMM. View Full-Text
Keywords: micro coordinate measuring machine; Abbe error free; three dimensional measurement micro coordinate measuring machine; Abbe error free; three dimensional measurement
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MDPI and ACS Style

Huang, Q.; Wu, K.; Wang, C.; Li, R.; Fan, K.-C.; Fei, Y. Development of an Abbe Error Free Micro Coordinate Measuring Machine. Appl. Sci. 2016, 6, 97.

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