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What We Can Learn about Ultrashort Pulses by Linear Optical Methods

Department of Optics and Quantum Electronics, University of Szeged, P.O. Box 406., H-6701 Szeged, Hungary
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Appl. Sci. 2013, 3(2), 515-544; https://doi.org/10.3390/app3020515
Received: 10 December 2012 / Revised: 10 April 2013 / Accepted: 10 April 2013 / Published: 26 April 2013
(This article belongs to the Special Issue Ultraintense Ultrashort Pulse Lasers)
Spatiotemporal compression of ultrashort pulses is one of the key issues of chirped pulse amplification (CPA), the most common method to achieve high intensity laser beams. Successful shaping of the temporal envelope and recombination of the spectral components of the broadband pulses need careful alignment of the stretcher-compressor stages. Pulse parameters are required to be measured at the target as well. Several diagnostic techniques have been developed so far for the characterization of ultrashort pulses. Some of these methods utilize nonlinear optical processes, while others based on purely linear optics, in most cases, combined with spectrally resolving device. The goal of this work is to provide a review on the capabilities and limitations of the latter category of the ultrafast diagnostical methods. We feel that the importance of these powerful, easy-to-align, high-precision techniques needs to be emphasized, since their use could gradually improve the efficiency of different CPA systems. We give a general description on the background of spectrally resolved linear interferometry and demonstrate various schematic experimental layouts for the detection of material dispersion, angular dispersion and carrier-envelope phase drift. Precision estimations and discussion of potential applications are also provided. View Full-Text
Keywords: pulse characterization; spectral interferometry; ultrashort pulses; dispersion pulse characterization; spectral interferometry; ultrashort pulses; dispersion
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MDPI and ACS Style

Borzsonyi, A.; Kovacs, A.P.; Osvay, K. What We Can Learn about Ultrashort Pulses by Linear Optical Methods. Appl. Sci. 2013, 3, 515-544.

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