Accurate Structural Parameter Retrieval for One-Dimensional Nanogratings in Mueller-Matrix Spectroscopic Ellipsometry Using an Element-Adaptive Hybrid Surrogate Model
Abstract
1. Introduction
2. Methodology
2.1. RCWA-Based Dataset Generation for One-Dimensional Periodic Nanostructures
2.2. Forward and Backward Modeling
2.3. Element-Adaptive Hybrid Surrogate Model for Iterative Fitting and Parameter Retrieval
3. Results and Discussion
3.1. MSE Comparison of Surrogate Models Under Measurement Noise
3.2. Structural-Parameter Retrieval
4. Conclusions
Supplementary Materials
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
Abbreviations
| MMSE | Mueller-matrix spectroscopic ellipsometry |
| RCWA | Rigorous coupled-wave analysis |
| MM | Mueller matrix |
| MASD | Mean absolute spectral difference |
| MSE | Mean squared error |
| MAE | Mean absolute error |
| CNN | Convolutional neural network |
| 1D | One-dimensional |
| AI | Artificial intelligence |
| FDTD | Finite-difference time-domain |
| FEM | Finite element method |
References
- IEEE International Roadmap for Devices and Systems (IRDS). The International Roadmap for Devices and Systems (IRDS) 2022 Edition: Executive Summary; Technical Report; IEEE: Piscataway, NJ, USA, 2022. [Google Scholar]
- Oh, J.; Son, J.; Yoon, C.; Hwang, E.; Ahn, J.; Lee, J.; Lee, J.; Shin, J.; Lee, D.; Lim, S.; et al. Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology. Nat. Commun. 2025, 16, 63511. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Politano, G.G.; Versace, C. Spectroscopic ellipsometry: Advancements, applications and future prospects in optical characterization. Spectrosc. J. 2023, 1, 163–181. [Google Scholar] [CrossRef] [Scilit]
- Hauge, P.S. Mueller matrix ellipsometry with imperfect compensators. J. Opt. Soc. Am. 1978, 68, 1519–1528. [Google Scholar] [CrossRef] [Scilit]
- Azzam, R.M.A. Mueller-matrix ellipsometry: A review. In Proceedings of the Polarization: Measurement, Analysis, and Remote Sensing, San Diego, CA, USA, 3 October 1997; SPIE: Bellingham, WA, USA, 1997; Volume 3121. [Google Scholar] [CrossRef] [Scilit]
- Furchner, A.; Kratz, C.; Ogieglo, W.; Pinnau, I.; Rappich, J.; Hinrichs, K. Ultrasensitive broadband infrared 4 × 4 Mueller-matrix ellipsometry for studies of depolarizing and anisotropic thin films. J. Vac. Sci. Technol. B Nanotechnol. Microelectron. 2020, 38, 014003. [Google Scholar] [CrossRef] [Scilit]
- Chen, X.; Gu, H.; Liu, J.; Chen, C.; Liu, S. Advanced Mueller matrix ellipsometry: Instrumentation and emerging applications. Sci. China Technol. Sci. 2022, 65, 2007–2030. [Google Scholar] [CrossRef] [Scilit]
- Otani, Y. Mueller Matrix Polarimeter for Nano-Structure Measurement. In Proceedings of the Conference on Lasers and Electro-Optics/Pacific Rim 2009, Shanghai, China, 30 August–3 September 2009; Optica Publishing Group: Washington, DC, USA, 2009; p. TuE2_2. [Google Scholar]
- Jian, Z.; Hejing, W. The physical meanings of 5 basic parameters for an X-ray diffraction peak and their application. Chin. J. Geochem. 2003, 22, 38–44. [Google Scholar] [CrossRef] [Scilit]
- Sadat, A.; Joye, I.J. Peak fitting applied to Fourier transform infrared and Raman spectroscopic analysis of proteins. Appl. Sci. 2020, 10, 5918. [Google Scholar] [CrossRef] [Scilit]
- Liu, S.; Chen, X.; Yang, T.; Guo, C.; Zhang, J.; Ma, J.; Chen, C.; Wang, C.; Zhang, C.; Liu, S. Machine learning aided solution to the inverse problem in optical scatterometry. Measurement 2022, 191, 110811. [Google Scholar] [CrossRef] [Scilit]
- Ka-Hyun, K. Spectroscopic Ellipsometry Measurement and Modeling of Hydrogenated Amorphous Silicon. J. Korean Sol. Energy Soc. 2019, 39, 11–19. [Google Scholar] [CrossRef] [Scilit]
- Xu, W.; Zhang, H.; Ji, L.; Li, Z. AI-Powered Next-Generation Technology for Semiconductor Optical Metrology: A Review. Micromachines 2025, 16, 838. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Losurdo, M.; Hingerl, K. (Eds.) Ellipsometry at the Nanoscale; Springer Series in Surface Sciences; Springer: Berlin/Heidelberg, Germany, 2013; Volume 52. [Google Scholar]
- Jung, J.; Kim, N.; Kim, K.; Park, J.; Cho, Y.J.; Chegal, W.; Kim, Y.J. Neural network-based analysis algorithm on Mueller matrix data of spectroscopic ellipsometry for the structure evaluation of nanogratings with various optical constants. Nanophotonics 2025, 14, 471–484. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Sullivan, D.M. Electromagnetic Simulation Using the FDTD Method; John Wiley & Sons: Hoboken, NJ, USA, 2013. [Google Scholar]
- Jagota, V.; Sethi, A.P.S.; Kumar, K. Finite element method: An overview. Walailak J. Sci. Technol. WJST 2013, 10, 1–8. [Google Scholar] [CrossRef] [Scilit]
- Moharam, M.G.; Grann, E.B.; Pommet, D.A.; Gaylord, T.K. Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary gratings. J. Opt. Soc. Am. A 1995, 12, 1068–1076. [Google Scholar] [CrossRef] [Scilit]
- Lalanne, P.; Morris, G.M. Highly improved convergence of the coupled-wave method for TM polarization. J. Opt. Soc. Am. A 1996, 13, 779–784. [Google Scholar] [CrossRef] [Scilit]
- Panoiu, N.C.; Sha, W.E.I.; Lei, D.Y.; Li, G.C. Nonlinear optics in plasmonic nanostructures. J. Opt. 2018, 20, 083001. [Google Scholar] [CrossRef] [Scilit]
- Moharam, M.G.; Gaylord, T.K. Rigorous coupled-wave analysis of planar-grating diffraction. J. Opt. Soc. Am. 1981, 71, 811–818. [Google Scholar] [CrossRef] [Scilit]
- Li, L. Use of Fourier series in the analysis of discontinuous periodic structures. J. Opt. Soc. Am. A 1996, 13, 1870–1876. [Google Scholar] [CrossRef] [Scilit]
- Huang, H.T.; Terry, F.L., Jr. Spectroscopic ellipsometry and reflectometry from gratings (Scatterometry) for critical dimension measurement and in situ, real-time process monitoring. Thin Solid Films 2004, 455–456, 828–836. [Google Scholar] [CrossRef] [Scilit]
- Foldyna, M.; De Martino, A.; Garcia-Caurel, E.; Ossikovski, R.; Licitra, C.; Bertin, F.; Postava, K.; Drévillon, B. Critical dimension of biperiodic gratings determined by spectral ellipsometry and Mueller matrix polarimetry. Eur. Phys. J. Appl. Phys. 2008, 42, 351–359. [Google Scholar] [CrossRef] [Scilit]
- Guo, C.; Shi, Y.; Wu, H.; Xiang, Y.; Li, W.; Zhang, C.; Liu, S. A combination of library search and Levenberg-Marquardt algorithm in optical scatterometry. Thin Solid Films 2023, 767, 139670. [Google Scholar] [CrossRef] [Scilit]
- Liu, J.; Zhang, D.; Yu, D.; Ren, M.; Xu, J. Machine learning powered ellipsometry. Light Sci. Appl. 2021, 10, 55. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Kfoury, P.; Battie, Y.; Naciri, A.E.; Voue, M.; Chaoui, N. Rapid ellipsometric imaging characterization of nanocomposite films with an artificial neural network. Opt. Lett. 2024, 49, 574–577. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Robertson, K.W.; LaPierre, R.R.; Krich, J.J. Efficient wave optics modeling of nanowire solar cells using rigorous coupled-wave analysis. Opt. Express 2019, 27, A133–A147. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Jung, J.; Kim, K.; Choi, J.; Kim, N.; Chegal, W.; Cho, Y.J.; Kim, Y.J. Geometric analysis algorithm based on a neural network with localized simulation data for nano-grating structure using Mueller matrix spectroscopic ellipsometry. Opt. Express 2023, 31, 44364–44374. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Mattila, A.; Nysten, J.; Heikkinen, V.; Kilpi, J.; Korpelainen, V.; Hansen, P.E.; Karvinen, P.; Kuittinen, M.; Lassila, A. Artificial neural network assisted spectral scatterometry for grating quality control. Meas. Sci. Technol. 2024, 35, 085025. [Google Scholar] [CrossRef] [Scilit]
- Jiang, Z.; Gan, Z.; Liang, C.; Li, W.D. Generic characterization method for nano-gratings using deep-neural-network-assisted ellipsometry. Nanophotonics 2024, 13, 1181–1189. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Sun, Q.; Jin, X.; Ma, B.; Lei, Z.; Liu, X.; Peng, J.; Yang, L. Non-destructive measurement of temperature in the micro-area wafer using Mueller matrix spectroscopic ellipsometry. In Proceedings of the Eighth International Workshop on Advanced Patterning Solutions (IWAPS 2024), Jiaxing, China, 15–16 October 2024; SPIE: Bellingham, WA, USA, 2024; Volume 13423, p. 1342310. [Google Scholar] [CrossRef] [Scilit]
- Kallioniemi, I.; Saarinen, J.; Oja, E. Optical scatterometry of subwavelength diffraction gratings: Neural-network approach. Appl. Opt. 1998, 37, 5830–5835. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Sabbagh, R.; Stothert, A.; Djurdjanovic, D. Machine learning for rapid inference of critical dimensions in optical metrology of nanopatterned surfaces. CIRP J. Manuf. Sci. Technol. 2023, 47, 184–192. [Google Scholar] [CrossRef] [Scilit]
- Godi Tchéré, M.; Robert, S.; Fawzi, Z.S.; Bayard, B.; Jamon, D.; Gourgon, C. Experimental identification of a grating profile using neural network classifiers in optical scatterometry. Appl. Opt. 2021, 60, 7929–7936. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Zhu, P.; Zhang, D.; Niu, X.; Liu, J.; Ren, M.; Xu, J. A Lightweight Neural Network for Spectroscopic Ellipsometry Analysis. Adv. Opt. Mater. 2024, 12, 2301381. [Google Scholar] [CrossRef] [Scilit]
- Jung, J.; Hwang, L.; Kim, N.; Kim, K.; Kim, S.; Park, J.; Chegal, W.; Cho, Y.J.; Kim, Y.J. AI-based analysis algorithm incorporating nanoscale structural variations and measurement-angle misalignment in spectroscopic ellipsometry. Nanophotonics 2025, 14, 5621–5632. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- So, S.; Badloe, T.; Noh, J.; Bravo-Abad, J.; Rho, J. Deep learning enabled inverse design in nanophotonics. Nanophotonics 2020, 9, 1041–1057. [Google Scholar] [CrossRef] [Scilit]
- Mudide, S.; Keller, N.; Andrew Antonelli, G.; Cruz, G.; Hart, J.; Bruccoleri, A.R.; Heilmann, R.K.; Schattenburg, M.L. Machine learning driven measurement of high-aspect-ratio nanostructures using Mueller matrix spectroscopic ellipsometry. J. Vac. Sci. Technol. B Nanotechnol. Microelectron. 2025, 43, 012801. [Google Scholar] [CrossRef] [Scilit]
- Csordás, R.; van Steenkiste, S.; Schmidhuber, J. Are neural nets modular? Inspecting functional modularity through differentiable weight masks. arXiv 2020, arXiv:2010.02066. [Google Scholar] [CrossRef] [Scilit]
- Jarvis, D.; Klein, R.; Rosman, B.; Saxe, A.M. On the specialization of neural modules. arXiv 2024, arXiv:2409.14981. [Google Scholar] [CrossRef] [Scilit]
- Gödecke, M.L.; Frenner, K.; Osten, W. Model-based characterisation of complex periodic nanostructures by white-light Mueller-matrix Fourier scatterometry. Light Adv. Manuf. 2021, 2, 18. [Google Scholar] [CrossRef] [Scilit]
- Fifty, C.; Amid, E.; Zhao, Z.; Yu, T.; Anil, R.; Finn, C. Efficiently Identifying Task Groupings for Multi-Task Learning. In NIPS’21: Proceedings of the 35th International Conference on Neural Information Processing Systems, 6–14 December 2021; Curran Associates Inc.: Red Hook, NY, USA, 2021; Volume 34, pp. 27503–27516. [Google Scholar]
- Qi, J.; Xue, P.; Zhang, R.; An, Y.; Wang, Z.; Li, M. Error correction for Mueller matrix ellipsometry based on a reference optical path. Appl. Opt. 2023, 62, 260–265. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Eilers, P.H.C. A perfect smoother. Anal. Chem. 2003, 75, 3631–3636. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Cobas, C. Applications of the Whittaker smoother in NMR spectroscopy. Magn. Reson. Chem. 2018, 56, 1140–1148. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Dorywalski, K.; Schmidt-Gründ, R.; Grundmann, M. Hybrid GA-gradient method for thin films ellipsometric data evaluation. J. Comput. Sci. 2020, 47, 101201. [Google Scholar] [CrossRef] [Scilit]
- Lee, C.; Rho, J. Benchmarking optimization methods enabling efficient designs for diverse nanophotonic applications. Adv. Opt. Mater. 2025, 13, 2500195. [Google Scholar] [CrossRef] [Scilit]
- Fu, L.; Wang, X.; Frenner, K.; Reichelt, S. Comparative analysis of grating reconstruction: Deep learning versus Levenberg-Marquardt methods. In Proceedings of the Modeling Aspects in Optical Metrology IX, Munich, Germany, 26–30 June 2023; SPIE: Bellingham, WA, USA, 2023; Volume 12619, p. 1261907. [Google Scholar] [CrossRef] [Scilit]
- Efron, B.; Tibshirani, R.J. An Introduction to the Bootstrap; Monographs on Statistics and Applied Probability; Chapman & Hall: New York, NY, USA, 1993; Volume 57. [Google Scholar]






| Method | RCWA-Based Optimization (nm) | Unified Surrogate Model-Based Optimization (nm) | Hybrid Surrogate Model-Based Optimization (nm) | |
|---|---|---|---|---|
| Parameter | ||||
| Period | 0.128 | 0.173 | 0.137 | |
| Height | 0.044 | 0.070 | 0.068 | |
| Top width | 0.040 | 0.087 | 0.080 | |
| Bottom width | 0.090 | 0.114 | 0.100 | |
| Parameter | Model | Min (nm) | Mean (nm) | SD (nm) | Median (nm) | P90 (nm) | P95 (nm) | Max (nm) |
|---|---|---|---|---|---|---|---|---|
| Period | Unified | 0.002 | 0.173 | 0.125 | 0.132 | 0.317 | 0.380 | 0.523 |
| Hybrid | 0.001 | 0.137 | 0.110 | 0.105 | 0.263 | 0.318 | 0.402 | |
| Height | Unified | 0.004 | 0.070 | 0.049 | 0.057 | 0.126 | 0.151 | 0.205 |
| Hybrid | 0.003 | 0.068 | 0.046 | 0.053 | 0.121 | 0.144 | 0.201 | |
| Top width | Unified | 0.001 | 0.087 | 0.071 | 0.065 | 0.168 | 0.204 | 0.298 |
| Hybrid | 0.002 | 0.080 | 0.063 | 0.062 | 0.153 | 0.185 | 0.275 | |
| Bottom width | Unified | 0.003 | 0.114 | 0.079 | 0.082 | 0.204 | 0.244 | 0.329 |
| Hybrid | 0.003 | 0.100 | 0.060 | 0.078 | 0.169 | 0.199 | 0.291 |
| Method | RCWA-Based Optimization (s) | Unified Surrogate Model-Based Optimization (s) | Hybrid Surrogate Model-Based Optimization (s) | |
|---|---|---|---|---|
| Time | ||||
| Time/iteration | 32 | |||
| Total time | 5472 | 0.51 | 0.71 | |
Disclaimer/Publisher’s Note: The statements, opinions and data contained in all publications are solely those of the individual author(s) and contributor(s) and not of MDPI and/or the editor(s). MDPI and/or the editor(s) disclaim responsibility for any injury to people or property resulting from any ideas, methods, instructions or products referred to in the content. |
© 2026 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license.
Share and Cite
Kim, S.; Hwang, L.; Kim, N.; Lee, H.; Kim, K.; Kim, Y.-J. Accurate Structural Parameter Retrieval for One-Dimensional Nanogratings in Mueller-Matrix Spectroscopic Ellipsometry Using an Element-Adaptive Hybrid Surrogate Model. Appl. Sci. 2026, 16, 8927. https://doi.org/10.3390/app16188927
Kim S, Hwang L, Kim N, Lee H, Kim K, Kim Y-J. Accurate Structural Parameter Retrieval for One-Dimensional Nanogratings in Mueller-Matrix Spectroscopic Ellipsometry Using an Element-Adaptive Hybrid Surrogate Model. Applied Sciences. 2026; 16(18):8927. https://doi.org/10.3390/app16188927
Chicago/Turabian StyleKim, Seri, Leeju Hwang, Nagyeong Kim, Hyungbin Lee, Kibaek Kim, and Young-Joo Kim. 2026. "Accurate Structural Parameter Retrieval for One-Dimensional Nanogratings in Mueller-Matrix Spectroscopic Ellipsometry Using an Element-Adaptive Hybrid Surrogate Model" Applied Sciences 16, no. 18: 8927. https://doi.org/10.3390/app16188927
APA StyleKim, S., Hwang, L., Kim, N., Lee, H., Kim, K., & Kim, Y.-J. (2026). Accurate Structural Parameter Retrieval for One-Dimensional Nanogratings in Mueller-Matrix Spectroscopic Ellipsometry Using an Element-Adaptive Hybrid Surrogate Model. Applied Sciences, 16(18), 8927. https://doi.org/10.3390/app16188927

