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Article

An Empirical Study of Fine-Tuning Pre-Trained Code Models and Adapters for the Classification of Source Code Plagiarism Instances

Department of Computer Science, University of Warwick, Coventry CV4 7AL, UK
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Author to whom correspondence should be addressed.
Appl. Sci. 2026, 16(14), 7156; https://doi.org/10.3390/app16147156 (registering DOI)
Submission received: 8 June 2026 / Revised: 9 July 2026 / Accepted: 10 July 2026 / Published: 16 July 2026
(This article belongs to the Section Computing and Artificial Intelligence)

Abstract

Source code plagiarism is a significant challenge in software engineering and computer science education, affecting academic integrity, intellectual property rights, and software quality assurance. However, Source Code Plagiarism Classification (SCPC) remains difficult because labelled training data are limited, mainly due to the sensitivity of plagiarism cases. This restricts the effective use of machine learning (ML) and deep learning (DL) methods, especially in low-resource settings. This work investigates low-resource SCPC using Pre-trained Code Models (PCMs). We first examine Full Fine-Tuning (FFT), where all model parameters are updated, across multiple public datasets. We then evaluate Parameter-Efficient Fine-Tuning (PEFT), where only a small subset of parameters is trained. Specifically, we apply three adapter-based PEFT methods and compare them with FFT in terms of classification performance, training time, inference time, GPU usage, trainable parameter percentage, and model size. The results show that, when labelled training data are available, fine-tuned PCMs achieve strong SCPC performance and higher F1 scores than the unsupervised open-source plagiarism-detection tools in our evaluation, JPlag and Dolos. Overall, PEFT achieves a performance that is similar, comparable to, or slightly lower than that of FFT, while requiring fewer trainable parameters and lower GPU usage, at the cost of slightly higher inference time.
Keywords: source code plagiarism detection; source code similarity; Pre-trained Code Models; Parameter-Efficient Fine-Tuning; adapters source code plagiarism detection; source code similarity; Pre-trained Code Models; Parameter-Efficient Fine-Tuning; adapters

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MDPI and ACS Style

Ebrahim, F.; Joy, M. An Empirical Study of Fine-Tuning Pre-Trained Code Models and Adapters for the Classification of Source Code Plagiarism Instances. Appl. Sci. 2026, 16, 7156. https://doi.org/10.3390/app16147156

AMA Style

Ebrahim F, Joy M. An Empirical Study of Fine-Tuning Pre-Trained Code Models and Adapters for the Classification of Source Code Plagiarism Instances. Applied Sciences. 2026; 16(14):7156. https://doi.org/10.3390/app16147156

Chicago/Turabian Style

Ebrahim, Fahad, and Mike Joy. 2026. "An Empirical Study of Fine-Tuning Pre-Trained Code Models and Adapters for the Classification of Source Code Plagiarism Instances" Applied Sciences 16, no. 14: 7156. https://doi.org/10.3390/app16147156

APA Style

Ebrahim, F., & Joy, M. (2026). An Empirical Study of Fine-Tuning Pre-Trained Code Models and Adapters for the Classification of Source Code Plagiarism Instances. Applied Sciences, 16(14), 7156. https://doi.org/10.3390/app16147156

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