Qian, W.; Guo, X.; Wang, S.; Xie, S.; Hao, Y.; Guo, X.
Three-Dimensional Scanning-Based Discrete Element Modeling, Contact Parameter Calibration, and Validation of Sugar Beet Roots. Appl. Sci. 2026, 16, 6194.
https://doi.org/10.3390/app16126194
AMA Style
Qian W, Guo X, Wang S, Xie S, Hao Y, Guo X.
Three-Dimensional Scanning-Based Discrete Element Modeling, Contact Parameter Calibration, and Validation of Sugar Beet Roots. Applied Sciences. 2026; 16(12):6194.
https://doi.org/10.3390/app16126194
Chicago/Turabian Style
Qian, Wang, Xingbang Guo, Shenying Wang, Shengshi Xie, Yang Hao, and Xin Guo.
2026. "Three-Dimensional Scanning-Based Discrete Element Modeling, Contact Parameter Calibration, and Validation of Sugar Beet Roots" Applied Sciences 16, no. 12: 6194.
https://doi.org/10.3390/app16126194
APA Style
Qian, W., Guo, X., Wang, S., Xie, S., Hao, Y., & Guo, X.
(2026). Three-Dimensional Scanning-Based Discrete Element Modeling, Contact Parameter Calibration, and Validation of Sugar Beet Roots. Applied Sciences, 16(12), 6194.
https://doi.org/10.3390/app16126194