Jing, S.; Mai, R.; Gao, X.; Du, W.; Zhao, R.; Luo, C.; Fan, Z.
A Method for Down Quality Inspection: YOLO-Based Impurity Detection and Quality Quantification. Appl. Sci. 2026, 16, 5086.
https://doi.org/10.3390/app16105086
AMA Style
Jing S, Mai R, Gao X, Du W, Zhao R, Luo C, Fan Z.
A Method for Down Quality Inspection: YOLO-Based Impurity Detection and Quality Quantification. Applied Sciences. 2026; 16(10):5086.
https://doi.org/10.3390/app16105086
Chicago/Turabian Style
Jing, Shaowen, Ruoyi Mai, Xiaofeng Gao, Weiyi Du, Ruipu Zhao, Chengran Luo, and Zhihui Fan.
2026. "A Method for Down Quality Inspection: YOLO-Based Impurity Detection and Quality Quantification" Applied Sciences 16, no. 10: 5086.
https://doi.org/10.3390/app16105086
APA Style
Jing, S., Mai, R., Gao, X., Du, W., Zhao, R., Luo, C., & Fan, Z.
(2026). A Method for Down Quality Inspection: YOLO-Based Impurity Detection and Quality Quantification. Applied Sciences, 16(10), 5086.
https://doi.org/10.3390/app16105086