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Journal: Appl. Sci., 2025
Volume: 15
Number: 2835
Article:
Detection of Small-Sized Electronics Endangering Facilities Involved in Recycling Processes Using Deep Learning
Authors:
by
Zizhen Liu, Shunki Kasugaya and Nozomu Mishima
Link:
https://www.mdpi.com/2076-3417/15/5/2835
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