Kim, M.; Kim, E.; Jung, S.; Kim, B.; Kim, J.; Kim, S.
Fault Detection Method Using Auto-Associative Shared Nearest Neighbor Kernel Regression for Industrial Processes. Appl. Sci. 2025, 15, 2251.
https://doi.org/10.3390/app15052251
AMA Style
Kim M, Kim E, Jung S, Kim B, Kim J, Kim S.
Fault Detection Method Using Auto-Associative Shared Nearest Neighbor Kernel Regression for Industrial Processes. Applied Sciences. 2025; 15(5):2251.
https://doi.org/10.3390/app15052251
Chicago/Turabian Style
Kim, Minseok, Eunkyeong Kim, Seunghwan Jung, Baekcheon Kim, Jinyong Kim, and Sungshin Kim.
2025. "Fault Detection Method Using Auto-Associative Shared Nearest Neighbor Kernel Regression for Industrial Processes" Applied Sciences 15, no. 5: 2251.
https://doi.org/10.3390/app15052251
APA Style
Kim, M., Kim, E., Jung, S., Kim, B., Kim, J., & Kim, S.
(2025). Fault Detection Method Using Auto-Associative Shared Nearest Neighbor Kernel Regression for Industrial Processes. Applied Sciences, 15(5), 2251.
https://doi.org/10.3390/app15052251