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Journal: Appl. Sci., 2025
Volume: 15
Number: 2009

Article: A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing
Authors: by Wenfa Zhan, Yangxinzi Zhou, Jiangyun Zheng, Xueyuan Cai, Qingping Zhang and Xiaoqing Wen
Link: https://www.mdpi.com/2076-3417/15/4/2009

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