Bai, J.; Zhu, W.; Liu, S.; Ye, C.; Zheng, P.; Wang, X.
A Temporal Convolutional Network–Bidirectional Long Short-Term Memory (TCN-BiLSTM) Prediction Model for Temporal Faults in Industrial Equipment. Appl. Sci. 2025, 15, 1702.
https://doi.org/10.3390/app15041702
AMA Style
Bai J, Zhu W, Liu S, Ye C, Zheng P, Wang X.
A Temporal Convolutional Network–Bidirectional Long Short-Term Memory (TCN-BiLSTM) Prediction Model for Temporal Faults in Industrial Equipment. Applied Sciences. 2025; 15(4):1702.
https://doi.org/10.3390/app15041702
Chicago/Turabian Style
Bai, Jinyin, Wei Zhu, Shuhong Liu, Chenhao Ye, Peng Zheng, and Xiangchen Wang.
2025. "A Temporal Convolutional Network–Bidirectional Long Short-Term Memory (TCN-BiLSTM) Prediction Model for Temporal Faults in Industrial Equipment" Applied Sciences 15, no. 4: 1702.
https://doi.org/10.3390/app15041702
APA Style
Bai, J., Zhu, W., Liu, S., Ye, C., Zheng, P., & Wang, X.
(2025). A Temporal Convolutional Network–Bidirectional Long Short-Term Memory (TCN-BiLSTM) Prediction Model for Temporal Faults in Industrial Equipment. Applied Sciences, 15(4), 1702.
https://doi.org/10.3390/app15041702