Order Article Reprints
Journal: Appl. Sci., 2025
Volume: 15
Number: 7020
Article:
Defect Detection and Error Source Tracing in Laser Marking of Silicon Wafers with Machine Learning
Authors:
by
Hsiao-Chung Wang, Teng-To Yu and Wen-Fei Peng
Link:
https://www.mdpi.com/2076-3417/15/13/7020
MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover
and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article
and designed to be complimentary to the journal.