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Journal: Appl. Sci., 2025
Volume: 15
Number: 6117
Article:
RML-YOLO: An Insulator Defect Detection Method for UAV Aerial Images
Authors:
by
Zhenrong Deng, Xiaoming Li and Rui Yang
Link:
https://www.mdpi.com/2076-3417/15/11/6117
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