Shi, P.; Zhang, Y.; Cao, Y.; Sun, J.; Chen, D.; Kuang, L.
DVCW-YOLO for Printed Circuit Board Surface Defect Detection. Appl. Sci. 2025, 15, 327.
https://doi.org/10.3390/app15010327
AMA Style
Shi P, Zhang Y, Cao Y, Sun J, Chen D, Kuang L.
DVCW-YOLO for Printed Circuit Board Surface Defect Detection. Applied Sciences. 2025; 15(1):327.
https://doi.org/10.3390/app15010327
Chicago/Turabian Style
Shi, Pei, Yuyang Zhang, Yunqin Cao, Jiadong Sun, Deji Chen, and Liang Kuang.
2025. "DVCW-YOLO for Printed Circuit Board Surface Defect Detection" Applied Sciences 15, no. 1: 327.
https://doi.org/10.3390/app15010327
APA Style
Shi, P., Zhang, Y., Cao, Y., Sun, J., Chen, D., & Kuang, L.
(2025). DVCW-YOLO for Printed Circuit Board Surface Defect Detection. Applied Sciences, 15(1), 327.
https://doi.org/10.3390/app15010327