Huang, W.; Tu, Z.; Di, Z.; Wang, C.; Su, Y.; Bi, H.
Large-Area Thickness Measurement of Transparent Films Based on a Multichannel Spectral Interference Sensor. Appl. Sci. 2024, 14, 2816.
https://doi.org/10.3390/app14072816
AMA Style
Huang W, Tu Z, Di Z, Wang C, Su Y, Bi H.
Large-Area Thickness Measurement of Transparent Films Based on a Multichannel Spectral Interference Sensor. Applied Sciences. 2024; 14(7):2816.
https://doi.org/10.3390/app14072816
Chicago/Turabian Style
Huang, Weihua, Zhengqian Tu, Zixiang Di, Chenhui Wang, Yunhao Su, and Hai Bi.
2024. "Large-Area Thickness Measurement of Transparent Films Based on a Multichannel Spectral Interference Sensor" Applied Sciences 14, no. 7: 2816.
https://doi.org/10.3390/app14072816
APA Style
Huang, W., Tu, Z., Di, Z., Wang, C., Su, Y., & Bi, H.
(2024). Large-Area Thickness Measurement of Transparent Films Based on a Multichannel Spectral Interference Sensor. Applied Sciences, 14(7), 2816.
https://doi.org/10.3390/app14072816