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Journal: Appl. Sci., 2024
Volume: 14
Number: 9836
Article:
D2-SPDM: Faster R-CNN-Based Defect Detection and Surface Pixel Defect Mapping with Label Enhancement in Steel Manufacturing Processes
Authors:
by
Taewook Wi, Minyeol Yang, Suyeon Park and Jongpil Jeong
Link:
https://www.mdpi.com/2076-3417/14/21/9836
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