Liu, Y.; Li, X.; Qiao, R.; Chen, Y.; Han, X.; Paul, A.; Wu, Z.
Lightweight Insulator and Defect Detection Method Based on Improved YOLOv8. Appl. Sci. 2024, 14, 8691.
https://doi.org/10.3390/app14198691
AMA Style
Liu Y, Li X, Qiao R, Chen Y, Han X, Paul A, Wu Z.
Lightweight Insulator and Defect Detection Method Based on Improved YOLOv8. Applied Sciences. 2024; 14(19):8691.
https://doi.org/10.3390/app14198691
Chicago/Turabian Style
Liu, Yanxing, Xudong Li, Ruyu Qiao, Yu Chen, Xueliang Han, Agyemang Paul, and Zhefu Wu.
2024. "Lightweight Insulator and Defect Detection Method Based on Improved YOLOv8" Applied Sciences 14, no. 19: 8691.
https://doi.org/10.3390/app14198691
APA Style
Liu, Y., Li, X., Qiao, R., Chen, Y., Han, X., Paul, A., & Wu, Z.
(2024). Lightweight Insulator and Defect Detection Method Based on Improved YOLOv8. Applied Sciences, 14(19), 8691.
https://doi.org/10.3390/app14198691