Lightweight Insulator and Defect Detection Method Based on Improved YOLOv8
Abstract
:1. Introduction
- For the problems of the small number of samples and unbalanced proportion in the existing dataset, this paper adopts a variety of data enhancement techniques, including methods such as brightness transformation and adding noise, to expand the size and diversity of the dataset. These enhancement techniques not only increase the number of samples in the dataset but also improve the robustness of the model. In addition, in this paper, the labels of discolored insulators are added on top of the existing labels of normal insulators and defective insulators. By incorporating the label type for discolored insulators, the dataset’s label types are enriched, allowing the model to identify more types of insulator defects and enhancing the comprehensiveness and accuracy of the detection.
- This paper takes the YOLOv8 target detection algorithm as the base network and makes lightweight improvement for its feature extraction module. Specifically, the MobileNetv3 model [29,30,31] is used to replace the C3 module and convolution module in the Backbone part of YOLOv8. MobileNetv3 adopts depthwise separable convolution and the BNeck module, which significantly reduce the computational complexity and parameter count of the model and make the model achieve lightweighting while maintaining high detection accuracy. In addition, this paper also optimizes the complexity of the improved model, which further improves the running efficiency of the model and makes it more suitable for deployment on resource-constrained embedded systems and mobile devices.
- Recognizing that insulator defects are often small target features in captured images susceptible to misidentification or oversight, this study integrates a lightweight attention mechanism to alleviate these challenges. A convolutional block attention module (CBAM) [32] module enhances the feature representation in the channel and spatial dimensions through two sub-modules, namely, channel and spatial attention, respectively, which increases the model’s attention to key features. This enhancement significantly boosts the accuracy of insulator and defect detection, especially when dealing with small target detection tasks.
2. Dataset Processing and Augmentation
2.1. Basic Dataset
2.2. Image Transformation for Data Augmentation
2.3. Noise Injection for Data Augmentation
2.4. Adding Label Variations
3. Improved YOLOv8 Lightweight Object Detection Network
3.1. Depthwise Separable Convolution
3.2. Lightweight YOLOv8s Enhancement
3.3. Integration of CBAM Attention Mechanism
4. Experimental Results and Analysis
4.1. Experimental Environment
4.2. Experimental Evaluation Metrics
4.3. Experimental Result Analysis
4.4. Ablation Experiment
4.5. Results
5. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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Insulator Detection AP/% | Defect Detection AP/% | Precision/% | Recall/% | mAP@0.5/% | GFLOPs/G | |
---|---|---|---|---|---|---|
SSD [23] | 89.3 | 87.2 | 79.6 | 80.7 | 88.3 | 115.7 |
Fast R-CNN [24] | 87.9 | 63.6 | 64.8 | 85.9 | 75.8 | 130.4 |
MobileNetv3 [31] | 88.4 | 80.8 | 92.7 | 76.3 | 84.6 | 6.3 |
YOLOv3 [39] | 91.6 | 82.2 | 90.5 | 83.5 | 87.9 | 154.6 |
ShuffleNetv2 [40] | 80.2 | 84.4 | 91.5 | 76.5 | 82.3 | 8.0 |
YOLOv8s [41] | 96.3 | 96.2 | 96.0 | 96.9 | 96.3 | 13.5 |
Our Improved Method | 98.9 | 97.8 | 97.4 | 98.4 | 98.3 | 7.2 |
Overall/% | Insulator/% | Defect/% | Fading/% | Parameters/Mb | GFLOPs/G | |
---|---|---|---|---|---|---|
Without CBAM | 93.8 | 96.9 | 99.1 | 84.9 | 3,940,765 | 7.1 |
With CBAM | 94.8 | 98.9 | 96.9 | 88.9 | 3,982,355 | 7.2 |
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Liu, Y.; Li, X.; Qiao, R.; Chen, Y.; Han, X.; Paul, A.; Wu, Z. Lightweight Insulator and Defect Detection Method Based on Improved YOLOv8. Appl. Sci. 2024, 14, 8691. https://doi.org/10.3390/app14198691
Liu Y, Li X, Qiao R, Chen Y, Han X, Paul A, Wu Z. Lightweight Insulator and Defect Detection Method Based on Improved YOLOv8. Applied Sciences. 2024; 14(19):8691. https://doi.org/10.3390/app14198691
Chicago/Turabian StyleLiu, Yanxing, Xudong Li, Ruyu Qiao, Yu Chen, Xueliang Han, Agyemang Paul, and Zhefu Wu. 2024. "Lightweight Insulator and Defect Detection Method Based on Improved YOLOv8" Applied Sciences 14, no. 19: 8691. https://doi.org/10.3390/app14198691
APA StyleLiu, Y., Li, X., Qiao, R., Chen, Y., Han, X., Paul, A., & Wu, Z. (2024). Lightweight Insulator and Defect Detection Method Based on Improved YOLOv8. Applied Sciences, 14(19), 8691. https://doi.org/10.3390/app14198691