Ruan, J.; He, J.; Tong, Y.; Wang, Y.; Fang, Y.; Qu, L.
Knowledge Embedding Relation Network for Small Data Defect Detection. Appl. Sci. 2024, 14, 7922.
https://doi.org/10.3390/app14177922
AMA Style
Ruan J, He J, Tong Y, Wang Y, Fang Y, Qu L.
Knowledge Embedding Relation Network for Small Data Defect Detection. Applied Sciences. 2024; 14(17):7922.
https://doi.org/10.3390/app14177922
Chicago/Turabian Style
Ruan, Jinjia, Jin He, Yao Tong, Yuchuan Wang, Yinghao Fang, and Liang Qu.
2024. "Knowledge Embedding Relation Network for Small Data Defect Detection" Applied Sciences 14, no. 17: 7922.
https://doi.org/10.3390/app14177922
APA Style
Ruan, J., He, J., Tong, Y., Wang, Y., Fang, Y., & Qu, L.
(2024). Knowledge Embedding Relation Network for Small Data Defect Detection. Applied Sciences, 14(17), 7922.
https://doi.org/10.3390/app14177922