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Journal: Appl. Sci., 2024
Volume: 14
Number: 4230
Article:
Assessing the Stress Induced by Novel Packaging in GaN HEMT Devices via Raman Spectroscopy
Authors:
by
Zainab Dahrouch, Giuliana Malta, Moreno d’Ambrosio, Angelo Alberto Messina, Mattia Musolino, Alessandro Sitta, Michele Calabretta and Salvatore Patanè
Link:
https://www.mdpi.com/2076-3417/14/10/4230
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