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Journal: Appl. Sci., 2024
Volume: 14
Number: 4230

Article: Assessing the Stress Induced by Novel Packaging in GaN HEMT Devices via Raman Spectroscopy
Authors: by Zainab Dahrouch, Giuliana Malta, Moreno d’Ambrosio, Angelo Alberto Messina, Mattia Musolino, Alessandro Sitta, Michele Calabretta and Salvatore Patanè
Link: https://www.mdpi.com/2076-3417/14/10/4230

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