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Dahrouch Z, Malta G, d’Ambrosio M, Messina AA, Musolino M, Sitta A, Calabretta M, Patanè S. Assessing the Stress Induced by Novel Packaging in GaN HEMT Devices via Raman Spectroscopy. Applied Sciences. 2024; 14(10):4230. https://doi.org/10.3390/app14104230

Dahrouch, Zainab, Giuliana Malta, Moreno d’Ambrosio, Angelo Alberto Messina, Mattia Musolino, Alessandro Sitta, Michele Calabretta, and Salvatore Patanè. 2024. "Assessing the Stress Induced by Novel Packaging in GaN HEMT Devices via Raman Spectroscopy" Applied Sciences 14, no. 10: 4230. https://doi.org/10.3390/app14104230

Dahrouch, Z., Malta, G., d’Ambrosio, M., Messina, A. A., Musolino, M., Sitta, A., Calabretta, M., & Patanè, S. (2024). Assessing the Stress Induced by Novel Packaging in GaN HEMT Devices via Raman Spectroscopy. Applied Sciences, 14(10), 4230. https://doi.org/10.3390/app14104230