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Journal: Appl. Sci., 2023
Volume: 13
Number: 10711

Article: Dynamic Reliability Assessment Method for a Pantograph System Based on a Multistate T-S Fault Tree, Dynamic Bayesian
Authors: by Yafeng Chen, Jing Wen, Yingjie Tian, Shubin Zheng, Qianwen Zhong and Xiaodong Chai
Link: https://www.mdpi.com/2076-3417/13/19/10711

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