Order Article Reprints

Tan G, Liang Z, Chi Y, Li Q, Peng B, Liu Y, Li J. Low-Quality Integrated Circuits Image Verification Based on Low-Rank Subspace Clustering with High-Frequency Texture Components. Applied Sciences. 2023; 13(1):155. https://doi.org/10.3390/app13010155

Tan, Guoliang, Zexiao Liang, Yuan Chi, Qian Li, Bin Peng, Yuan Liu, and Jianzhong Li. 2023. "Low-Quality Integrated Circuits Image Verification Based on Low-Rank Subspace Clustering with High-Frequency Texture Components" Applied Sciences 13, no. 1: 155. https://doi.org/10.3390/app13010155

Tan, G., Liang, Z., Chi, Y., Li, Q., Peng, B., Liu, Y., & Li, J. (2023). Low-Quality Integrated Circuits Image Verification Based on Low-Rank Subspace Clustering with High-Frequency Texture Components. Applied Sciences, 13(1), 155. https://doi.org/10.3390/app13010155