Tan, G.; Liang, Z.; Chi, Y.; Li, Q.; Peng, B.; Liu, Y.; Li, J.
Low-Quality Integrated Circuits Image Verification Based on Low-Rank Subspace Clustering with High-Frequency Texture Components. Appl. Sci. 2023, 13, 155.
https://doi.org/10.3390/app13010155
AMA Style
Tan G, Liang Z, Chi Y, Li Q, Peng B, Liu Y, Li J.
Low-Quality Integrated Circuits Image Verification Based on Low-Rank Subspace Clustering with High-Frequency Texture Components. Applied Sciences. 2023; 13(1):155.
https://doi.org/10.3390/app13010155
Chicago/Turabian Style
Tan, Guoliang, Zexiao Liang, Yuan Chi, Qian Li, Bin Peng, Yuan Liu, and Jianzhong Li.
2023. "Low-Quality Integrated Circuits Image Verification Based on Low-Rank Subspace Clustering with High-Frequency Texture Components" Applied Sciences 13, no. 1: 155.
https://doi.org/10.3390/app13010155
APA Style
Tan, G., Liang, Z., Chi, Y., Li, Q., Peng, B., Liu, Y., & Li, J.
(2023). Low-Quality Integrated Circuits Image Verification Based on Low-Rank Subspace Clustering with High-Frequency Texture Components. Applied Sciences, 13(1), 155.
https://doi.org/10.3390/app13010155