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Journal: Appl. Sci., 2023
Volume: 13
Number: 107
Article:
Effect of P+ Source Pattern in 4H-SiC Trench-Gate MOSFETs on Low Specific On-Resistance
Authors:
by
Jee-Hun Jeong, Min-Seok Jang, Ogyun Seok and Ho-Jun Lee
Link:
https://www.mdpi.com/2076-3417/13/1/107
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