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Journal: Appl. Sci., 2022
Volume: 12
Number: 650
Article:
Application of Deep Learning and Symmetrized Dot Pattern to Detect Surge Arrester Status
Authors:
by
Meng-Hui Wang, Shiue-Der Lu and Chun-Chun Hung
Link:
https://www.mdpi.com/2076-3417/12/2/650
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