Fuscaldo, W.; Maita, F.; Maiolo, L.; Beccherelli, R.; Zografopoulos, D.C.
Broadband Dielectric Characterization of High-Permittivity Rogers Substrates via Terahertz Time-Domain Spectroscopy in Reflection Mode. Appl. Sci. 2022, 12, 8259.
https://doi.org/10.3390/app12168259
AMA Style
Fuscaldo W, Maita F, Maiolo L, Beccherelli R, Zografopoulos DC.
Broadband Dielectric Characterization of High-Permittivity Rogers Substrates via Terahertz Time-Domain Spectroscopy in Reflection Mode. Applied Sciences. 2022; 12(16):8259.
https://doi.org/10.3390/app12168259
Chicago/Turabian Style
Fuscaldo, Walter, Francesco Maita, Luca Maiolo, Romeo Beccherelli, and Dimitrios C. Zografopoulos.
2022. "Broadband Dielectric Characterization of High-Permittivity Rogers Substrates via Terahertz Time-Domain Spectroscopy in Reflection Mode" Applied Sciences 12, no. 16: 8259.
https://doi.org/10.3390/app12168259
APA Style
Fuscaldo, W., Maita, F., Maiolo, L., Beccherelli, R., & Zografopoulos, D. C.
(2022). Broadband Dielectric Characterization of High-Permittivity Rogers Substrates via Terahertz Time-Domain Spectroscopy in Reflection Mode. Applied Sciences, 12(16), 8259.
https://doi.org/10.3390/app12168259