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Journal: Appl. Sci., 2022
Volume: 12
Number: 8139
Article:
Dynamic Single-Electron Transistor Modeling for High-Frequency Capacitance Characterization
Authors:
by
Alka Singh, Tomoki Nishimura, Hiroaki Satoh and Hiroshi Inokawa
Link:
https://www.mdpi.com/2076-3417/12/16/8139
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