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Journal: Appl. Sci., 2022
Volume: 12
Number: 6113

Article: Influence of Quality of Mounting Process of RF Transistors on Their Thermal Parameters and Lifetime
Authors: by Krzysztof Górecki, Wojciech Kowalke and Przemysław Ptak
Link: https://www.mdpi.com/2076-3417/12/12/6113

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