The SXFEL Upgrade: From Test Facility to User Facility
Abstract
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Liu, B.; Feng, C.; Gu, D.; Gao, F.; Deng, H.; Zhang, M.; Sun, S.; Chen, S.; Zhang, W.; Fang, W.; et al. The SXFEL Upgrade: From Test Facility to User Facility. Appl. Sci. 2022, 12, 176. https://doi.org/10.3390/app12010176
Liu B, Feng C, Gu D, Gao F, Deng H, Zhang M, Sun S, Chen S, Zhang W, Fang W, et al. The SXFEL Upgrade: From Test Facility to User Facility. Applied Sciences. 2022; 12(1):176. https://doi.org/10.3390/app12010176
Chicago/Turabian StyleLiu, Bo, Chao Feng, Duan Gu, Fei Gao, Haixiao Deng, Meng Zhang, Sen Sun, Si Chen, Wei Zhang, Wencheng Fang, and et al. 2022. "The SXFEL Upgrade: From Test Facility to User Facility" Applied Sciences 12, no. 1: 176. https://doi.org/10.3390/app12010176
APA StyleLiu, B., Feng, C., Gu, D., Gao, F., Deng, H., Zhang, M., Sun, S., Chen, S., Zhang, W., Fang, W., Wang, Z., Zhou, Q., Leng, Y., Gu, M., Yin, L., Gu, Q., Fang, G., Wang, D., & Zhao, Z. (2022). The SXFEL Upgrade: From Test Facility to User Facility. Applied Sciences, 12(1), 176. https://doi.org/10.3390/app12010176

