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Journal: Appl. Sci., 2021
Volume: 11
Number: 2788

Article: Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization
Authors: by Petr Polovodov, Didier Théron, Clément Lenoir, Dominique Deresmes, Sophie Eliet, Christophe Boyaval, Gilles Dambrine and Kamel Haddadi
Link: https://www.mdpi.com/2076-3417/11/6/2788

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