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Journal: Appl. Sci., 2021
Volume: 11
Number: 2788
Article:
Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization
Authors:
by
Petr Polovodov, Didier Théron, Clément Lenoir, Dominique Deresmes, Sophie Eliet, Christophe Boyaval, Gilles Dambrine and Kamel Haddadi
Link:
https://www.mdpi.com/2076-3417/11/6/2788
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