Polovodov, P.; Théron, D.; Lenoir, C.; Deresmes, D.; Eliet, S.; Boyaval, C.; Dambrine, G.; Haddadi, K.
Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization. Appl. Sci. 2021, 11, 2788.
https://doi.org/10.3390/app11062788
AMA Style
Polovodov P, Théron D, Lenoir C, Deresmes D, Eliet S, Boyaval C, Dambrine G, Haddadi K.
Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization. Applied Sciences. 2021; 11(6):2788.
https://doi.org/10.3390/app11062788
Chicago/Turabian Style
Polovodov, Petr, Didier Théron, Clément Lenoir, Dominique Deresmes, Sophie Eliet, Christophe Boyaval, Gilles Dambrine, and Kamel Haddadi.
2021. "Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization" Applied Sciences 11, no. 6: 2788.
https://doi.org/10.3390/app11062788
APA Style
Polovodov, P., Théron, D., Lenoir, C., Deresmes, D., Eliet, S., Boyaval, C., Dambrine, G., & Haddadi, K.
(2021). Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization. Applied Sciences, 11(6), 2788.
https://doi.org/10.3390/app11062788
