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Journal: Appl. Sci., 2021
Volume: 11
Number: 10720
Article:
Electrothermal Reliability of the High Electron Mobility Transistor (HEMT)
Authors:
by
Abdelhamid Amar, Bouchaïb Radi and Hami El Abdelkhalak
Link:
https://www.mdpi.com/2076-3417/11/22/10720
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