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Volume 11
Issue 21
10.3390/app112110272
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Article

A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser

by
Bocheng Ding
1,2,3,
Weiqing Xu
3,*,
Ruichang Wu
1,3,
Yunfei Feng
1,3,
Lifang Tian
1,3,
Xiaohong Li
1,3,
Jianye Huang
1,3,
Zhi Liu
1,3 and
Xiaojing Liu
1,3,*
1
School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China
2
University of Chinese Academy of Sciences, Beijing 100049, China
3
Center for Transformative Science, ShanghaiTech University, Shanghai 201210, China
*
Authors to whom correspondence should be addressed.
Appl. Sci. 2021, 11(21), 10272; https://doi.org/10.3390/app112110272
Submission received: 8 October 2021 / Revised: 25 October 2021 / Accepted: 26 October 2021 / Published: 2 November 2021
(This article belongs to the Special Issue New Science Opportunities at Short Wavelength Free Electron Lasers)
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Abstract

Velocity map imaging (VMI) spectrometry is widely used to measure the momentum distribution of charged particles with the kinetic energy of a few tens of electronVolts. With the progress of femtosecond laser and X-ray free-electron laser, it becomes increasingly important to extend the electron kinetic energy to 1 keV. Here, we report on a recently built composite VMI spectrometer at the Shanghai soft X-ray free-electron laser, which can measure ion images and high-energy electron images simultaneously. In the SIMION simulation, we extended the electron kinetic energy to 1 keV with a resolution <2% while measuring the ions with the kinetic energy of 20 eV. The experimental performance is tested by measuring Ar 2p photoelectron spectra at Shanghai Synchrotron Radiation Facility, and O+ kinetic energy spectrum from dissociative ionization of O2 by 800 nm femtosecond laser. We reached a resolution of 1.5% at the electron kinetic energy of 500 eV. When the electron arm is set for 100 eV, a resolution of 4% is reached at the ion kinetic energy of 5.6 eV. This composite VMI spectrometer will support the experiment, such as X-ray multi-photon excitation/ionization, Auger electrons emission, attosecond streaking.
Keywords: velocity map imaging; Synchrotron Radiation; femtosecond laser; free-electron laser velocity map imaging; Synchrotron Radiation; femtosecond laser; free-electron laser

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MDPI and ACS Style

Ding, B.; Xu, W.; Wu, R.; Feng, Y.; Tian, L.; Li, X.; Huang, J.; Liu, Z.; Liu, X. A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser. Appl. Sci. 2021, 11, 10272. https://doi.org/10.3390/app112110272

AMA Style

Ding B, Xu W, Wu R, Feng Y, Tian L, Li X, Huang J, Liu Z, Liu X. A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser. Applied Sciences. 2021; 11(21):10272. https://doi.org/10.3390/app112110272

Chicago/Turabian Style

Ding, Bocheng, Weiqing Xu, Ruichang Wu, Yunfei Feng, Lifang Tian, Xiaohong Li, Jianye Huang, Zhi Liu, and Xiaojing Liu. 2021. "A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser" Applied Sciences 11, no. 21: 10272. https://doi.org/10.3390/app112110272

APA Style

Ding, B., Xu, W., Wu, R., Feng, Y., Tian, L., Li, X., Huang, J., Liu, Z., & Liu, X. (2021). A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser. Applied Sciences, 11(21), 10272. https://doi.org/10.3390/app112110272

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