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Journal: Appl. Sci., 2020
Volume: 10
Number: 8234

Article: Exploring the Capabilities of Scanning Microwave Microscopy to Characterize Semiconducting Polymers
Authors: by Olivier Douhéret, Didier Théron and David Moerman
Link: https://www.mdpi.com/2076-3417/10/22/8234

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