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Journal: Appl. Sci., 2020
Volume: 10
Number: 8171

Article: Dual-Kernel-Based Aggregated Residual Network for Surface Defect Inspection in Injection Molding Processes
Authors: by Hwaseop Lee and Kwangyeol Ryu
Link: https://www.mdpi.com/2076-3417/10/22/8171

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