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Journal: Metals, 2024
Volume: 14
Number: 650
Article:
SDD-YOLO: A Lightweight, High-Generalization Methodology for Real-Time Detection of Strip Surface Defects
Authors:
by
Yueyang Wu, Ruihan Chen, Zhi Li, Minhua Ye and Ming Dai
Link:
https://www.mdpi.com/2075-4701/14/6/650
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